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Polynomial approximation to universal M‐shell ionisation cross‐sections induced by H + and He 2+ ions
Author(s) -
Taborda A.,
Chaves P. C.,
Carvalho M. L.,
Reis M. A.
Publication year - 2013
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2483
Subject(s) - ionization , polynomial , ion , cross section (physics) , shell (structure) , physics , l shell , work (physics) , atomic physics , mathematics , materials science , quantum mechanics , mathematical analysis , earth's magnetic field , magnetic field , composite material
The calculation of ionisation cross‐sections induced by H + and He 2+ ions in efficient ways for inclusion in simulation programmes to determine the X‐ray intensities is still extremely useful, in spite of the significant computer power available nowadays. Particle‐induced X‐ray emission studies have been mostly carried out using K‐shell and L‐shell X‐ray emission. However, the new microcalorimeter detection systems available will make M‐shell and higher shell X‐ray emission data increasingly important. Quantification and simulation of X‐ray intensities require one to be able to compute the ionisation cross‐sections, which can be carried out using the ECPSSR theory. Nevertheless, this is not an efficient process, and therefore, in previous work, K and L‐shells universal ionisation cross‐section curves were found as well as polynomial approximations to the universal curves. In this work, polynomial approximations to the M‐shell universal ionisation cross‐sections are presented, and calculated ionisation and X‐ray production cross‐sections based on the polynomial approximations are compared with results from literature. These polynomial approximations were included in the X‐ray intensities simulation programme DT2simul, based on LibCPIXE, and the results obtained are compared with experimental data for several elements and compound samples. Copyright © 2013 John Wiley & Sons, Ltd.