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XRF spectrometer calibration for copper determination in wood
Author(s) -
Zielenkiewicz T.,
Zawadzki J.,
Radomski A.
Publication year - 2012
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2416
Subject(s) - copper , calibration curve , nitric acid , analytical chemistry (journal) , spectrometer , chemistry , calibration , preservative , mineralogy , materials science , metallurgy , chromatography , detection limit , optics , mathematics , physics , statistics , food science
Method of X‐ray fluorescence (XRF) spectrometer calibration for copper analysis in wood was elaborated. Copper salt standard solutions for XRF measurements of liquid samples were prepared, and calibration curve of copper content dependence on impulse counts was determined. Specimens of pine wood ( Pinus sylvestris L.) were treated with different solutions of copper‐based preservative (alkaline copper quarternary ammonium compound type) applying model low‐pressure preservation process. After treatment, wood specimens were sliced into six pieces, and exposed surfaces were analyzed using mapping option of XRF spectrometer. Then, wood from each analyzed surface was peeled with abrasive paper and dissolved in 65% nitric (V) acid. Copper content in solutions was determined using obtained calibration curve, and calibration dependence of copper content in wood on the average impulse counts on particular surfaces was calculated. Obtained results of copper content were consistent with values calculated on the basis of differences of samples weight before and after treatment. It confirms that proposed procedure is correct, and obtained equation may be used for unknown samples examination. Copyright © 2012 John Wiley & Sons, Ltd.