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Relative intensities of different reflection order X‐ray lines registered by microprobe analyzers
Author(s) -
Lavrent'ev Yu.G.,
Korolyuk V.N.,
Nigmatulina E.N.,
Karmanov N.S.
Publication year - 2012
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2408
Subject(s) - microprobe , reflection (computer programming) , crystal (programming language) , analytical chemistry (journal) , optics , order (exchange) , spectrometer , range (aeronautics) , spectrum analyzer , chemistry , materials science , physics , mineralogy , computer science , finance , chromatography , economics , composite material , programming language
Relative intensities of X‐ray lines for various reflection orders are measured using a JXA‐8100 microprobe analyzer. Spectra obtained using standard analyzing crystals LiF, PET, TAP, LDE1, and LDE2 are studied. We observe and explain specific features of spectrometers with curved analyzing crystals that influence higher order reflections. The second‐order intensities are similar for different analyzing crystals and lie in the range 2.4 (PET)–5.6% (LiF) of the first‐order intensity. Higher order reflections show more variation. For example, for the LDE2 crystal, no lines of higher than the second‐order were observed, whereas for TAP reflections of up to eighth order were detected. The data obtained may be used for reference purposes. Copyright © 2012 John Wiley & Sons, Ltd.