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Determination of Pb, Zr, Ti, Sr, Cr, Nb and La in lead zirconate titanate ceramics by particle‐induced X‐ray emission
Author(s) -
García Rafael Hernández,
Behar Moni,
Dias Johnny Ferraz,
Tagle Margarita Edelia Villanueva,
Rodríguez María Dolores Durruthy,
Paula Calderón Piñar Francisco,
Alfonso Mario Simeón Pomares
Publication year - 2012
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2377
Subject(s) - ceramic , analytical chemistry (journal) , materials science , inductively coupled plasma , lead zirconate titanate , stoichiometry , homogeneity (statistics) , zirconate , mineralogy , titanate , chemistry , metallurgy , plasma , environmental chemistry , ferroelectricity , dielectric , physics , optoelectronics , statistics , mathematics , quantum mechanics , organic chemistry
A particle‐induced X‐ray emission (PIXE) technique has been used in the determination of the principal components Pb, Zr and Ti and the substituting elements Sr, Cr, Nb and La in lead zirconate titanate ceramics. In general, precision of analysis was concentration dependent from each element under study. For Pb, precision varied between 0.13% and 0.16%, at higher concentration of 59.32–64.5%. It was around 6–9% for Sr, Cr and Nb at concentrations of 1% or lower. Particular attention was devoted to the estimation of the analysis trueness. With this purpose, three methods were applied: (1) comparison of PIXE and inductively coupled plasma optical emission spectrometry concentrations, (2) recovery study and (3) comparison with a laboratory standard. Trueness of analysis was around 100 ± 10% for the evaluated elements Pb, Zr, Ti, Sr and Cr. The expected stoichiometry and elemental composition homogeneity of a wide group of produced ceramics were confirmed by the PIXE technique. Copyright © 2012 John Wiley & Sons, Ltd.