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PIXE–RBS survey of a Meissen porcelain snuff box: first version or not?
Author(s) -
Neelmeijer C.,
Roscher R.
Publication year - 2012
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2371
Subject(s) - glaze , glazing , rutherford backscattering spectrometry , materials science , ion beam analysis , painting , characterization (materials science) , mineralogy , composite material , beam (structure) , optics , ion beam , art , chemistry , visual arts , nanotechnology , physics , ceramic , thin film
Non‐destructive materials analysis provided essential knowledge for deciding on the complete authenticity of a unique work of art made from porcelain, rich of delicate painting. The combination of ion‐beam based methods proton‐induced X‐ray emission (PIXE) and Rutherford‐backscattering spectrometry (RBS) was able to make simultaneously available both bulk composition and surface characterization. Potential differences in glazing and painting materials were verified when examining the base body and the lid of the box. In particular, RBS from Pb atoms in the near‐surface depth region could identify lead‐glazing for the shaded porcelain of the bottom. The chemical composition of the brilliant glaze of the lid was proved by PIXE to conform to the typical Meissen recipe. Consequently, a later completed or restored object was deduced. Copyright © 2012 John Wiley & Sons, Ltd.