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EDXRF with an audio digitizer
Author(s) -
Nakaye Yasukazu,
Kawai Jun
Publication year - 2011
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1367
Subject(s) - full width at half maximum , linearity , detector , energy (signal processing) , silicon drift detector , channel (broadcasting) , materials science , physics , analytical chemistry (journal) , optics , chemistry , computer science , telecommunications , chromatography , quantum mechanics
We utilized an audio digitizer in energy‐dispersive X‐ray fluorescence (EDXRF) with a silicon drift detector and achieved a full width at half maximum (FWHM) of 178 eV at Mn Kα (92‐µs peaking time). To confirm the ability of EDXRF with an audio digitizer, we also examined energy versus channel number linearity and output count rate. We applied it to EDXRF analysis of (ZnCd)S : Ag and showed a proper energy versus channel number linearity from 5.9 keV (Mn Kα) to 26.1 keV (Cd Kβ). And, the maximum output count rate of more than 10 kcps was obtained with 23‐µs peaking time (296‐eV FWHM). Copyright © 2011 John Wiley & Sons, Ltd.