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Application of X‐ray fluorescence spectrometry on quality control of scintillation crystals
Author(s) -
Zhuo Shangjun,
Shen Ruxiang,
Sheng Cheng
Publication year - 2011
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1359
Subject(s) - dopant , analytical chemistry (journal) , doping , crystal (programming language) , inductively coupled plasma , detection limit , x ray fluorescence , scintillator , calibration , spectroscopy , fluorescence , materials science , mass spectrometry , fluorescence spectroscopy , chemistry , nuclear chemistry , physics , optics , optoelectronics , chromatography , plasma , quantum mechanics , detector , computer science , programming language
Abstract The major components PbO and WO 3 in PWO crystals, Bi 2 O 3 and GeO 2 in BGO crystals, as well as Gd, La, Nb, Mg, Mo, Bi, Sb and Y doped in PWO crystals and Eu doped in BGO crystals were successfully determined with X‐ray fluorescence spectroscopy (XRF) using fusion techniques. Calibration standards were synthesized with high‐purity oxides and standard solutions. The analysis results can meet the general requirements of the quality control of the crystal growth and research purpose. The relative standard deviations for Bi 2 O 3 , GeO 2 , PbO and WO 3 are 0.21%, 0.18%, 0.25% and 0.22%, respectively ( k = 8). The detection limits for dopants in PWO are below 5 µg/g for Gd, La, Nb, Mo, Sb and Y and below 20 µg/g for Mg and Bi. The detection limits for Eu doped in BGO are 8 µg/g. The testing results of XRF were compared with those of inductively coupled plasma optical emission spectroscopy. It was found that the relative differences of the testing results between the two methods are less than 10% for most dopants in PWO crystals. Copyright © 2011 John Wiley & Sons, Ltd.