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A procedure using polychromatic excitation and scattered radiation for matrix correction in x‐ray microfluorescence analysis
Author(s) -
Lankosz M.,
Pella P. A.
Publication year - 1995
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300240607
Subject(s) - excitation , matrix (chemical analysis) , sample (material) , materials science , spectral power distribution , optics , x ray , atomic number , analytical chemistry (journal) , physics , atomic physics , chemistry , quantum mechanics , composite material , thermodynamics , chromatography
A fundamental‐parameters method using x‐ray tube excitation was developed for use in the x‐ray microfluorescence analysis of flat, optically polished geological specimens. In this procedure, the coherent and incoherent tube target lines scattered from the sample are used to calculate the average atomic number and mass thickness of the sample. The polychromatic tube spectral distribution is calculated from a published algorithm. Since elements such as carbon, hydrogen and oxygen are unmeasurable, their contribution for the purposes of matrix correction can be represented by two hypothetical elements which span each side of the calculated average atomic number of the low‐ Z matrix. This procedure is applicable to infinitely thick samples and also those of intermediate thickness, and was tested on glasses of known composition.