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Choice of optimum conditions for x‐ray excitation of elements with low atomic number
Author(s) -
Pavlinsky G. V.,
Dukhanin A. Yu.
Publication year - 1995
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300240604
Subject(s) - x ray tube , ionization , atomic physics , atomic number , excitation , anode , auger , matrix (chemical analysis) , electron , x ray , secondary electrons , auger effect , boron , analytical chemistry (journal) , chemistry , materials science , ion , electrode , physics , optics , quantum mechanics , organic chemistry , chromatography
The influence of the factors (window thickness, anode material and voltage on the x‐ray tube) that determine the x‐ray fluorescence intensity of elements with low atomic number (boron, carbon, nitrogen, oxygen, fluorine) is considered. The conditions for maximum x‐ray fluorescence intensity of the elements considered are greatly dependent on the matrix composition, as the ionization of an atom by the photo‐ and Auger electrons becomes significant. The calculations, performed for various matrices, show how the decrease in tube window thickness influences the x‐ray fluorescence intensity. Both the effective excitation by the primary radiation of the element measured and main matrix elements, providing high‐energy photo‐ and Auger electrons, should be taken into account when selecting the anode material. It was found that, in contrast to higher atomic number elements, the voltage increase at the tube contributes only insignificantly to the increase in the analytical signal for the elements considered. The software developed provide modelling of any analytical situation aimed at a quick selection of the optimum conditions for analysis of the elements being discussed.