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Description of x‐ray beams using the fluorescence yields of a set of thick targets
Author(s) -
Martínez C.,
Delgado V.
Publication year - 1995
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300240509
Subject(s) - fluorescence , x ray fluorescence , spectral power distribution , yield (engineering) , beam (structure) , distribution (mathematics) , set (abstract data type) , optics , materials science , x ray , analytical chemistry (journal) , chemistry , physics , mathematics , computer science , mathematical analysis , chromatography , metallurgy , programming language
Quantitative methods in x‐ray fluorescence analysis require a knowledge of the spectral distribution of the fluorescence‐exciting beam. The use of XRF yield measurements of a set of thick pure element targets is proposed for the description of a fluorescence‐exciting x‐ray beam, without the need to obtain its spectral distribution. This new approach is derived theoretically and verified by comparing thin‐target yields calculated from XRF yield measurements of thick pure element specimens with those obtained from a calculated spectral distribution. The difference between the two methods of obtaining the thin‐target yields is within 9% relative error.