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Total reflection x‐ray fluorescence analysis of light elements under various excitation conditions
Author(s) -
Streli C.,
Wobrauschek P.,
Ladisch W.,
Rieder R.,
Aiginger H.
Publication year - 1995
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300240310
Subject(s) - monochromator , synchrotron radiation , total internal reflection , x ray fluorescence , optics , fluorescence , spectrometer , penetration depth , radiation , materials science , excitation , x ray , photon , reflection (computer programming) , synchrotron , analytical chemistry (journal) , chemistry , physics , wavelength , chromatography , quantum mechanics , computer science , programming language
Total reflction x‐ray fluorescence (TXRF) analysis was tested for its suitability for the photon‐induced energy dispersiver analysis of light elements such as B, C, N, O, F, Na and Mg using a special spectrometer meeting the requirements for the detection of low‐energy fluorescence radiation. The influence of different spectral modification devices such as a high‐energy cut‐off reflector and a multilayer monochromator were compared using excitation by a Cr tube and also synchrotron radiation. The effects on intensity, background and detection lilmits are compared and discussed. A new method of monitoring the x‐ray beam to adjust total reflection by a CCD camera is introduced. Considerations on the penetration depth and information depth of light elements are presented.