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Determination of the mean size of submicron particles by electron probe microanalysis
Author(s) -
Berner A.,
Levin I.,
Klinger L.,
Brandon D. G.
Publication year - 1995
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300240105
Subject(s) - electron microprobe , microanalysis , electron probe microanalysis , particle size , electron , matrix (chemical analysis) , analytical chemistry (journal) , materials science , particle (ecology) , chemistry , physics , metallurgy , chromatography , nuclear physics , composite material , geology , oceanography , organic chemistry
A method for the determination of the mean size of submicron particles randomly distributed in a matrix by electron probe x‐ray microanalysis (EPMA) is described. The method is based on an analysis of variance of the characteristic x‐ray intensity from an element contained only in the particle. Analytical expressions relating this variance to the mean size of the particles were derived and the method was validated using test samples. The present technique can be used with a conventional x‐ray microanalyser for the rapid determination of the mean size of submicron particles.