Premium
Peak‐to‐background method for standardless electron microprobe analysis of particles
Author(s) -
Trincavelli J.,
Van Grieken R.
Publication year - 1994
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300230605
Subject(s) - electron microprobe , electron , particle (ecology) , microprobe , analytical chemistry (journal) , computational physics , cathode ray , single particle analysis , materials science , detector , point (geometry) , optics , chemistry , physics , mathematics , mineralogy , chromatography , nuclear physics , metallurgy , oceanography , geometry , geology , aerosol , organic chemistry
A peak‐to‐background method was implemented for standardless electron microprobe analysis of bulk samples and particles. First, a study on the choice of the beam entry point was performed; the region of the particle closest to the detector proved to be the most convenient. Then, a very simple algorithm, which does not require any kind of standard, was developed for particle analysis. This method was tested for glass standard particles and the results were compared with those given by other methods; the proposed standardless approach appeared to yield very satisfactory results.