Premium
Monte carlo simulation of the scattering contributions to the XRF line
Author(s) -
JorgeSánchez Héctor,
Sartori Renzo
Publication year - 1994
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300230309
Subject(s) - monte carlo method , scattering , physics , line (geometry) , computational physics , statistical physics , photon , plane (geometry) , monte carlo method for photon transport , optics , dynamic monte carlo method , mathematics , geometry , direct simulation monte carlo , statistics
A Monte Carlo program to simulate the scattering contributions to the x‐ray fluorescent line was developed. Simulations were carried out on three pure samples ( Z = 14, 28 and 40) in several geometrical situations (incident and take‐off directions of the photons). The results show that the scattering effects do not exceed 4% for the analysed elements in the X‐ray regime. Good agreement between normal incidence simulations and theoretical results was found. The vanishing of second‐order interactions inside the sample when the propagation plane approximates π/2 was also verified.