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Determination of selected trace elements in silicates by electron and proton probe microanalysis
Author(s) -
Sweeney R. J.,
Jablonski W.,
Sie S. H.
Publication year - 1994
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300230210
Subject(s) - electron microprobe , electron probe microanalysis , analytical chemistry (journal) , microanalysis , calibration , proton , materials science , calibration curve , electron , radiochemistry , detection limit , mineralogy , chemistry , metallurgy , physics , nuclear physics , environmental chemistry , organic chemistry , chromatography , quantum mechanics
The elements Nb, Zr, Ta, Y, Ce, Nd, Lu, Ba and Sr were calibrated on a wavelength‐dispersive spectrometerequipped electron probe microanalyser (EPMA) using existing standards and a Ta‐bearing primary glass standard manufactured for Ta calibration. These calibrations were tested using a manufactured secondary glass standard doped with 600‐1800 ppm of these elements. The EPMA calibrations reproduced the glass secondary standard concentrations to within ±10% relative (except for Y) with detection limits of 40‒100 ppm. The accuracy of this technique was compared with that of proton‐induced x‐ray emission (PIXE) determinations on the secondary standard.