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Simultaneous matrix and background correction method and its application in XRF concentration determination of trace elements in geological materials
Author(s) -
Hua Younan,
Yap C. T.
Publication year - 1994
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300230106
Subject(s) - matrix (chemical analysis) , trace (psycholinguistics) , interference (communication) , absorption (acoustics) , position (finance) , work (physics) , optics , analytical chemistry (journal) , physics , materials science , chemistry , computer science , chromatography , telecommunications , channel (broadcasting) , philosophy , linguistics , finance , economics , thermodynamics
Compton scattered radiation has been used as an internal standard to compensate for matrix absorption effects; it has also been used separately for background correction. In this work, the simultaneous matrix and background correction method was developed, in which both matrix absorption effects and background correction are performed simultaneously, thereby reducing the measurement time; this is particularly important when dealing with large numbers of samples. It also obviates the problem in the conventional method of correcting for the background when the interference‐free background position near the spectral peaks cannot be found. Application of this method to a large number of geological standard reference materials yields values of trace element concentrations in good agreement with their recommended values.