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Empirical equations for calculating wavelengths of x‐ray characteristic lines and absorption edges
Author(s) -
Norrish K.,
Tao G. Y.
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220608
Subject(s) - wavelength , absorption (acoustics) , enhanced data rates for gsm evolution , absorption edge , computational physics , optics , line (geometry) , magic (telescope) , mathematics , physics , mathematical analysis , materials science , geometry , computer science , astrophysics , quantum mechanics , telecommunications , band gap
Abstract Empirical equations for calculating the wavelengths of x‐ray characteristic lines and absorption edges were proposed and their effectiveness was compared with that of the empirical equations used in the programs MAGIC IV, FRAME C and NBSGSC. The proposed equations were proved to give the smallest number of mistakes which lead to an error of the calculated wavelength causing an analytical line to be on the wrong side of an absorption edge.