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Determination of incident angle in radioisotope‐excited EDXRF
Author(s) -
Somogyi A.,
Pázsit Á
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220605
Subject(s) - matrix (chemical analysis) , excited state , atomic number , materials science , analytical chemistry (journal) , atomic physics , chemistry , physics , chromatography
Three different methods were used for the determination of the effective incident angle related to EDXRF when radioisotope annular sources are involved: weighted averaging, Compton peak method and minimization of the difference between the certificated and measured concetrations of six international standard samples. By measuring the Compton peak energies of various analytical reagent grade elements and compounds, it was found that the incoherent peak energy depends on the mean atomic number of the matrix, so the effective incident angle is also matrix dependent.