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A fast convergence procedure for a direct determination method in XRF
Author(s) -
Wang Yongzhong
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220506
Subject(s) - convergence (economics) , path (computing) , sample (material) , attenuation , mathematics , algorithm , computer science , mathematical optimization , optics , physics , chemistry , chromatography , economics , programming language , economic growth
A comparison among current methods in x‐ray spectrometry showed that it is possible to abandon the traditional concept of comparing unknown samples with standards if it is expected that unknown samples with a rough surface can be determined directly without sample preparation. The error caused by the uncertainties of the fundamental parameters can be reduced and the effect of the attenuation in the x‐ray path on the intensities of the characteristic fluorescent x‐rays can also be accounted for by the introduction of the instrumental factors P ik which are initially determined. In order to speed up the calculation, a new iterative equation is presented in the direct determination method. In addition, a new way to select the starting values in the iteration and a simplified way to iterate the calculation are presented. With these improvements, the convergence in iteration is faster than before.