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Monte Carlo simulation of conventional and synchrotron energy‐dispersive x‐ray spectrometers
Author(s) -
Janssens K.,
Vincze L.,
Van Espen P.,
Adams F.
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220412
Subject(s) - spectrometer , monte carlo method , synchrotron radiation , synchrotron , calibration , physics , optics , computational physics , radiation , energy (signal processing) , statistics , mathematics , quantum mechanics
A number of examples of the use of a detailed Monte Carlo (MC) simulation program for EDXRF spectrometers is discussed. The MC code is employed to predict the complete spectral response of a polychromatic EDXRF spectrometer using different excitation conditions. With respect to quantification of steel samples in which significant enhancement and self‐absorption occur, the usefulness of the code in simulating spectra corresponding to calibration standards is demonstrated. An extension of the program that deals with simulating the interaction of polarized radiation with matter is used to estimate the analytical qualities of currently operating and future mono‐and polychromatic synchrotron radiation XRF spectrometers.