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Method for quantitative XRF analysis of inhomogeneous thin specimens
Author(s) -
Markowicz A.,
Haselberger N.,
Whai Zin Oo U.
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220309
Subject(s) - materials science , computer science
A simple method for the quantitative XRF analysis of inhomogeneously loaded thin samples is described. Both the theoretical basis of the method and the results of an experimental test are presented.