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Structural and Chemical Analysis of Materials: X‐ray, Electron and Neutron Diffraction, X‐ray, Electron and Ion Spectrometry, Electron Microscopy. J. P. Eberhart Published by John Wiley & Sons Ltd, Chichester, 1991; 545 pages; ISBN 0 471 92977 8
Author(s) -
Gilfrich John
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220213
Subject(s) - neutron diffraction , x ray , electron , chemistry , crystallography , library science , physics , analytical chemistry (journal) , nuclear physics , computer science , crystal structure , chromatography