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X‐ray fluorescence line intensity expressions for the real divergence beam of an x‐ray tube
Author(s) -
Verkhovodov P. A.
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220210
Subject(s) - x ray , intensity (physics) , optics , x ray tube , tube (container) , divergence (linguistics) , line (geometry) , beam (structure) , physics , fluorescence , x ray fluorescence , materials science , geometry , mathematics , linguistics , philosophy , electrode , anode , quantum mechanics , composite material
A model for fluorescence radiation line intensity calculations with consideration of x‐ray tube primary beam radiation divergence and actual sample bulk, from which fluorescence radiation is registered at the detector, is proposed. Expressions are provided for commercial instruments having extended and circular sources. These expressions are valid for the short‐wavelength region of the spectrum and for substantial beam divergence, while the commonly used equations are invalid.