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Sample transparency effects in tin determination by x‐ray fluorescence
Author(s) -
Couture Rex A.
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220208
Subject(s) - tin , transparency (behavior) , fluorescence , x ray , materials science , chemistry , analytical chemistry (journal) , optics , computer science , chromatography , physics , metallurgy , computer security
A method is presented for the accurate trace determination of tin by wavelength‐dispersive x‐ray fluorescence with a rhodium tube. Because Sn Kα radiation and the incident radiation are very penetrating, sample transparency corrections and special background corrections are required. Explicit equations are derived for transparency corrections with polychromatic incident radiation. The 1/ r 2 dependence of incident intensity strongly affects the corrections. Using a simple, semi‐empirical correction procedure, and synthetic standards ranging from Al 2 O 3 to Fe 2 O 3 , a calibration graph had a standard error of the estimate of only 1.8%. The detection limit is typically 3.5–4 ppm.