Premium
Determination of ωγ using the tilt of the propagation plane
Author(s) -
Sánchez Héctor Jorge,
Rubio Marcelo
Publication year - 1993
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300220207
Subject(s) - tilt (camera) , plane (geometry) , binary number , product (mathematics) , yield (engineering) , set (abstract data type) , line (geometry) , materials science , fluorescence , analytical chemistry (journal) , optics , mathematics , physics , computer science , geometry , chemistry , chromatography , arithmetic , programming language , metallurgy
The product of fluorescence yield (ω) and emission probability (Γ), was measured using a method based on the propagation plane inclination. Measurements of the Kα line of elements such as Cr, Fe and Ni on binary samples were carried out to determine the product ωΓ. The results were compared with those reported in well known compilations. The proposed procedure can be considered a new alternative to increase the available set of methods for measuring fundamental parameters.