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Chemical analysis of ream defect in float glass
Author(s) -
Liu D. R.,
Park J.S,
Benoit R. E.,
Jackson F. D.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210607
Subject(s) - float glass , electron microprobe , microanalysis , analytical chemistry (journal) , flat glass , materials science , isotropic etching , chemical composition , mineralogy , etching (microfabrication) , chemistry , metallurgy , composite material , environmental chemistry , organic chemistry , layer (electronics)
To identify the source of a ream defect in float glass, the chemical composition of the ream has to be accurately determined, which can only be achieved by the electron probe microanalysis (EPMA) technique. Two ream samples were analyzed with EPMA. Because of the high mobility of the Na ion, caution had to be exercised to use a very low electron beam density during data acquisition. The results show that the reams in both cases are SiO 2 rich, but one has more Na whereas the other has less Na than the base glass, pointing to possible different causes to the ream problems. In view of the fact that the compositional difference between a ream and the base glass is very small, several approaches were used to confirm the analytical results: the statistical t ‐test, the digital elemental mapping and the compositional profiling. The differential etching analysis technique was also used to supplement the information on the chemistry and structure of a ream.