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Calculation of x‐ray fluorescence and scattered primary radiation intensitie in x‐ray fluorescence analysis of powder slurry‐like materials
Author(s) -
Finkelshtein A. L.,
Gunicheva T. N.,
Kalughin A. G.,
Afonin V. P.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210606
Subject(s) - slurry , x ray , x ray fluorescence , fluorescence , radiation , materials science , analytical chemistry (journal) , poisson distribution , optics , physics , chemistry , composite material , mathematics , chromatography , statistics
Analytical equations for calculating x‐ray fluorescence and scattered primary radiation intensities in x‐ray fluorescence analysis of slurries and slurry‐like materials are proposed. These equations are derived for the slurry model, in which the space distribution of the solid‐phase particles is described by Poisson's law. The computation results are compared with literature data and the authors' experience.