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Characterization of an x‐ray source for the fundamental parameter method
Author(s) -
Pozsgai I.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210510
Subject(s) - characterization (materials science) , microanalysis , environmental scanning electron microscope , scanning transmission electron microscopy , x ray , optics , microscope , scanning electron microscope , conventional transmission electron microscope , materials science , transmission electron microscopy , electron microscope , electron , analytical chemistry (journal) , physics , chemistry , nuclear physics , organic chemistry , chromatography
In addition to low detection limits, x‐ray fluorescene analysis (XRF) with a transmission x‐ray source in the scanning electron microscope has other favourable features as a consequence of the microscope environment, e.g. selection of area for XRF by backscattered electron imaging or electron probe microanalysis. Another favourable feature, the ease of determining the energy distribution of the intensity of the x‐ray source, is discussed.