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Validity of a simple approximation for enhancement calculations
Author(s) -
Rössiger V.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210509
Subject(s) - simple (philosophy) , substitution (logic) , computational physics , radiation , materials science , optics , atomic physics , physics , computer science , philosophy , epistemology , programming language
For calculating secondary XRF intensities, the substitution of the isotrope emission of the enhancing radiation by an emission with a few discrete angles leads to considerably reduced numerical effort. The validity of this previously suggested approximation of the enhancement effect is discussed for the analsysis of multilayer system in the nm and μm region and for bulk materials.