Premium
Lorentzian contributions to x‐ray lineshapes in Si(Li) spectroscopy
Author(s) -
Campbell J. L.,
Wang J.X.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210506
Subject(s) - monochromator , detector , spectral line , spectroscopy , physics , atomic physics , energy (signal processing) , x ray spectroscopy , optics , quantum mechanics , wavelength
If the lineshape response of a Si(Li) detector is measured using monoenergetic x‐rays provided by a monochromator, it must be convoluted by a Lorentzian of appropriate width in order to represent the lineshape encountered in directly measured x‐ray spectra. It is shown that the Lorentzian component is responsible for a significant fraction of low‐energy peak tailing, a phenomenon usually attributed to detector imperfections.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom