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Lorentzian contributions to x‐ray lineshapes in Si(Li) spectroscopy
Author(s) -
Campbell J. L.,
Wang J.X.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210506
Subject(s) - monochromator , detector , spectral line , spectroscopy , physics , atomic physics , energy (signal processing) , x ray spectroscopy , optics , quantum mechanics , wavelength
If the lineshape response of a Si(Li) detector is measured using monoenergetic x‐rays provided by a monochromator, it must be convoluted by a Lorentzian of appropriate width in order to represent the lineshape encountered in directly measured x‐ray spectra. It is shown that the Lorentzian component is responsible for a significant fraction of low‐energy peak tailing, a phenomenon usually attributed to detector imperfections.