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A compton peak method for incident angle determination in XRF with annular excitation
Author(s) -
Greaves E. D.,
Bohus L. Sajo,
Marcó L.,
Alvarez M.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210306
Subject(s) - excitation , compton scattering , optics , physics , sensitivity (control systems) , energy (signal processing) , computational physics , scattering , quantum mechanics , electronic engineering , engineering
Established methods for measuring the incident angle related to XRF when radioisotope annular sources are involved are briefly discussed. As an alternative technique, a direct measurement of the incident angle from the measured spectrum of the Compton scattered energy was developed. Analysing published experimental data, the limit of validity of this new approach is defined and it is established that for the sensitivity determination only the spectral data are required.