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Compton peak shift in XRF study of graphite
Author(s) -
Kundra K. D.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210304
Subject(s) - compton scattering , graphite , diaphragm (acoustics) , beam (structure) , materials science , magnitude (astronomy) , physics , atomic physics , scattering , optics , astrophysics , composite material , acoustics , loudspeaker
A significant shift from the theoretical position of the Compton peak was observed in a graphite sample using Rh Kα radiation. The magnitude of the Rh Kα Compton peak shift depends on both the thickness of the graphite sample and the x‐ray beam diaphragm used. The larger the specimen thickness or the beam diaphragm size, the greater is the magnitude of the Compton peak shift. This Compton peak shift is interpreted as being due to the change in the ‘effective’ scattering angle, and it occurs with very light elements only.