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Measurement of the spectral distribution of a diffraction x‐ray tube with a solid‐state detector
Author(s) -
Görgl R.,
Wobrauschek P.,
Kregsamer P.,
Streli Ch.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210110
Subject(s) - x ray tube , detector , spectral power distribution , tube (container) , diffraction , solid state , materials science , sensitivity (control systems) , x ray , spectral line , optics , fluorescence , spectrum (functional analysis) , distribution (mathematics) , analytical chemistry (journal) , physics , chemistry , mathematics , electronic engineering , mathematical analysis , electrode , engineering physics , quantum mechanics , astronomy , chromatography , anode , composite material , engineering
A knowledge of the spectral distribution method emitted by an x‐ray tube is important for all calculations in quantitative x‐ray fluorescence analysis. A simple way of directly measuring the primary spectrum of an x‐ray tube with a solid‐state detector is presented. For samples which meet thin‐film criteria sensitivity factors based on the measured primary spectrum were calculated and compared with experimental values.