Premium
Measurement of intensities of some newly observed diagram lines in the L‐emission spectra of 57 La to 63 Eu
Author(s) -
Shrivastava B. D.,
Gupta G. D.,
Joshi S. K.
Publication year - 1992
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300210108
Subject(s) - spectral line , diagram , emission spectrum , atomic physics , physics , mathematics , statistics , astronomy
A method is described for the estimation of relative intensities of weak diagram lines from the microphotometer records of x‐ray emission spectra registered on photographic films. The method is based on first correlating the experimentally determined relative intensities of two intense diagram lines with the theoretically calculated relative intensities. The experimental relative intensities of weak diagram lines are then interpolated to yield the corrected experimental relative intensities. These interpolated experimental relative intensities are found to be in good agreement with the theoretical relative intensities. The method has been applied to some recently reported weak lines in the L‐emission spectra of the rare earth 57 La to 63 Eu.