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Sample area dependence in quantitative EDXRF analysis
Author(s) -
Boman J.
Publication year - 1991
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300200613
Subject(s) - sample (material) , sample size determination , function (biology) , line (geometry) , intensity (physics) , mathematics , statistics , optics , physics , geometry , thermodynamics , evolutionary biology , biology
The measurement of small, thin samples with an area of the order of mm 2 with the ordinary EDXRF technique requires that special care be taken to include the sample size in the evaluation of element concentrations. Results are reported obtained using a standard procedure for the evalution of small samples used in the author's laboratory. This procedure makes use of an input parameter, viz. a ‘geometrical factor’ corresponding to the sample area which is used in the evaluation software. The results show that an almost straight line can be fitted to describe the parameter as a function of sample area for small samples (with an area of the order of mm 2 ), but that the corrections for inhomogeneity of the beam intensity are needed in many cases. For large samples (with an area of the order of cm 2 ) the parameter is equal to unity.