Multi‐element trace analysis of rocks and soils by EDXRF using polarized radiation | Zendy

Heckel J. | Zendy; Brumme M. | Zendy; Weinert A. | Zendy; Irmer K. | Zendy

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Multi‐element trace analysis of rocks and soils by EDXRF using polarized radiation

Author(s) -

Heckel J.,

Brumme M.,

Weinert A.,

Irmer K.

Publication year - 1991

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.1300200608

Subject(s) - trace element , atomic number , soil water , matrix (chemical analysis) , analytical chemistry (journal) , radiation , certified reference materials , trace (psycholinguistics) , compton scattering , scattering , mineralogy , materials science , chemistry , optics , physics , atomic physics , detection limit , geology , environmental chemistry , soil science , composite material , metallurgy , chromatography , linguistics , philosophy

An XRF device using polarized x‐rays for trace element analysis of rocks and soils has been developed. During a measuring time of 1000 s (two single measurements of 750 and 250 s, respectively), 36 elements with atomic numbers 22 ≤ Z ≤ 92 and detection limits between 15 and 0.3 ppm can be determined with high precision. The ratio between the net counts from a characteristic line of the element being determined and the number of background counts caused mainly by Compton scattering is used for the matrix correction procedure. Absorption and enhancement effects by major sample element concentrations are taken into account. Good agreement was found between analytical results and certified values for standard reference materials.

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