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Calculation of depth distribution functions for characteristic x‐radiation using an electron scattering model. I—theory
Author(s) -
August HansJürgen,
Wernisch Johann
Publication year - 1991
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300200306
Subject(s) - scattering , electron , radiation , physics , ionization , electron scattering , computational physics , distribution function , cross section (physics) , distribution (mathematics) , atomic physics , function (biology) , optics , mathematics , quantum mechanics , mathematical analysis , ion , biology , evolutionary biology
The depth distribution function for characteristic x‐radiation is calculated using a simple electron scattering model, which quantifies the amount of electrons being scattered back and forth in the sample. The quantities used for the calculation are the transmission and backscattering coefficients, the corresponding energy and angular distributions and the ionization cross‐section. The physical background and implications of this model are discussed.