Premium
Measurement of M‐shell x‐ray production cross‐sections using 5.96‐keV photons
Author(s) -
Garg R. R.,
Singh S.,
Shahi J. S.,
Mehta D.,
Singh N.,
Trehan P. N.,
Kumar S.,
Garg M. L.,
Mangal P. C.
Publication year - 1991
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300200210
Subject(s) - shell (structure) , photon , x ray fluorescence , physics , fluorescence , excitation , atomic physics , x ray , electron shell , nuclear physics , materials science , optics , ion , ionization , quantum mechanics , composite material
M‐shell x‐ray production/fluorescence (M XRF) cross‐sections for five elements with 81 ≤ Z ≤ 92 were measured at 5.96‐keV incident photon energy using thin targets. From the measured M XRF cross‐sections the average M‐shell fluorescence yields were derived. Experimental results for XRF cross‐sections and fluorescence yields were compared with theory. The experimental results were found to be higher than the theoretical values by 10–17%. Further experimental investigations on M XRF cross‐sections for more elements at different excitation energies are required in order to check the validity of the theoretical parameters used to calculate the M XRF cross‐sections.