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A standardless ZAF correction for semi‐quantitative electron probe microanalysis of microscopical particles
Author(s) -
Van Borm W. A.,
Adams F. C.
Publication year - 1991
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300200204
Subject(s) - fortran , microanalysis , particle (ecology) , electron probe microanalysis , particle size , electron , computational physics , chemistry , electron microprobe , analytical chemistry (journal) , computer science , mineralogy , physics , nuclear physics , chromatography , oceanography , organic chemistry , geology , operating system
A procedure for automaied microanalysis is adapted from a correction procedure for bulk samples. A particle size correction, based on the projected diameter of the particle, assumed to be spherical, is implemented when the diameter is less than or equal to the electron interaction diameter. A bulk correction is applied in the opposite case. The method is applicable to K‐ and L‐lines for the elements Na to Bi. The method is implemented in a FORTRAN computer program QUANTA written for personal computers. The procedure offers interactive control of several parameters of a single ZAF correction as it is capable of processing the massive amount of data produced by automated analysis of large particle collections. The method uses literature data on a number of fundamental parameters and performs the ZAF corrections by making a compromise between calculation speed and accuracy using first‐order corrections for backscattering, absorption and secondary fluorescence effects. It was tested on a set of alloy standards, mineral standards and mineral particle standards.