Premium
Structure of electrodeposited films of cobalt and nickel: Fourier analysis of the EXAFS of the x‐ray K‐absorption edges
Author(s) -
Sinha Benu,
Nigam Amar Nath
Publication year - 1990
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300190602
Subject(s) - nickel , cobalt , extended x ray absorption fine structure , materials science , amorphous solid , analytical chemistry (journal) , copper , absorption (acoustics) , metal , absorption spectroscopy , crystallography , optics , chemistry , metallurgy , composite material , physics , chromatography
Using a 30‐cm bent crystal transmission spectrograph in Canchois geometry, the x‐ray K‐absorption edges of cobalt and nickel were recorded using both pure metal foils and electrodeposited films on a copper foil substrate. For nickel, electrodeposition was also done in the presence of an externally applied magnetic field of 52 G in order to obtain a magnetized film. This film revealed only a slightly different EXAFS spectrum. A chemically plated amorphous film of nickel containing 8% phosphorus was also studied. All the EXAFS were subjected to Fourier transform analysis, which revealed how the nearest neighbouring atom distances change in different films compared with those in pure metal foils.