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Calibration of analytical spectrometers and metrological aims of quantitative analysis
Author(s) -
Kotlyarov Yakov B.
Publication year - 1990
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300190504
Subject(s) - metrology , calibration , computer science , quantitative analysis (chemistry) , sample (material) , mathematics , chemistry , statistics , chromatography
The mathematical criteria of calibration, which reflect the metrological aims of quantitative analysis, are formulated. It is shown that the traditionally used calibration procedure is not adequate for these criteria when using the analytical techniques which are required to solve jointly the calibration functions for concentrations in the course of the analysis. A procedure which avoids this shortcoming is proposed. It stipulates the simultaneous construction of the calibration functions and is based on the utilization of a specially introduced metrological index, the ‘indicator of the inaccuracy of a sample analysis’. The paper theory is illustrated by examples in x‐ray fluorescence analysis.