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Quantitative XRF analysis of surface layers: Procedure for the determination of thickness and composition
Author(s) -
Rössiger V.,
Thomas H.J.
Publication year - 1990
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300190503
Subject(s) - composition (language) , surface (topology) , materials science , analytical chemistry (journal) , mineralogy , chemistry , chromatography , mathematics , geometry , philosophy , linguistics
Based on a fundamental parameter treatment, a procedure was developed to determine the thickness and composition of surface (multi)layers from measured XRF data. The main features of a computer program are described and some applications are discussed.