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Determination of sample thickness via scattered radiation in x‐ray fluorescence spectrometry with filtered continuum excitation
Author(s) -
Araújo M. Fátima,
Van Espen P.,
Van Grieken R.
Publication year - 1990
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300190107
Subject(s) - radiation , calibration , x ray , foil method , slurry , calibration curve , analytical chemistry (journal) , x ray fluorescence , excitation , mass spectrometry , sample (material) , materials science , optics , x ray tube , fluorescence , chemistry , physics , detection limit , chromatography , electrode , quantum mechanics , composite material , anode
A semi‐empirical approach is described for determining the mass per unit area of a sample being analysed. The method can be used to estimate the concentration of minor and trace elements in matrices containing a substantial amount of light elements. The procedure utilizes the coherently and incoherently scattered radiation induced in the sample by the filtered continuum radiation of a rhodium x‐ray tube. The relationship between the intensity of the scattered radiation per unit mass and the average atomic number of the sample is established via calibration graphs, which can be applied for different x‐ray tube voltages and for different primary beam filters. The overall procedure was validated by the analysis of several geological standards, deposited as thin slurries of unknown thickness either on Mylar foil or on Nuclepore filters.