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L α /L β ; and L α /L γ x‐ray intensity ratios for elements in the range Z = 55–80
Author(s) -
Raghavaiah C. V.,
Rao N. Venkateswara,
Reddy S. Bhuloka,
Satyanarayana G.,
Murty G. Sree Krishna,
Rao M. V. S. Chandrasekhar,
Sastry D. L.
Publication year - 1990
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300190105
Subject(s) - analyser , analytical chemistry (journal) , physics , range (aeronautics) , intensity (physics) , excitation , energy (signal processing) , resolution (logic) , polynomial , degree (music) , atomic physics , optics , chemistry , materials science , mathematics , mathematical analysis , chromatography , quantum mechanics , artificial intelligence , computer science , composite material , acoustics
A systematic study of L α /L β and L α /L γ x‐ray intensity ratios was undertaken by measuring the characteristic x‐ray intensities in 23 elements over the range Z = 55‐80, using a 30 mCi 238 Pu source of excitation and a high‐resolution Si(Li) detector system coupled to a computer‐controlled multi‐channel analyser. The theoretical predictions due to Scofield were computed for the present energy (weighted average) of 15.28 keV excitation and compared with the experimental values. The experimental values of L α /L β and L α /L γ versus Z were fitted to a fourth‐degree polynomial, and most probable values of L α /L β and L α /L γ at each Z were also determined using this fit.