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EXAFS measurement with laboratory equipment: Problems and their countermeasures
Author(s) -
Okamoto Tokuhiko,
Yamashita Seiichi,
Yamaguchi Toshio,
Wakita Hisanobu
Publication year - 1990
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300190104
Subject(s) - extended x ray absorption fine structure , xanes , surface extended x ray absorption fine structure , absorption (acoustics) , impurity , anode , cathode , materials science , spectrometer , analytical chemistry (journal) , absorption spectroscopy , spectral line , filter (signal processing) , optics , chemistry , physics , electrode , computer science , organic chemistry , chromatography , astronomy , composite material , computer vision
Experimental techniques for eliminating the characteristic x‐rays emitted from impurities in cathode and anode materials in the vicinity of the x‐ray absorption edge were studied with a laboratory EXAFS spectrometer using a rotating anode. Two methods are proposed for this purpose, a current‐control system and a filter method involving the use of a material that selectively absorbs characteristic x‐rays. The former method was applied to the Co, Ni and Zn K absorption spectra and the latter to a Pd K absorption spectrum, and the results were compared with those obtained from conventional measurements. The change in the nearest neighbour structure of Pd in a Pd‐Al 2 O 3 catalyst accompanied by oxidation or reduction was clarified by EXAFS and XANES measurements with the use of the filter method.