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Image analysis and signal processing in electron microscopy. P. W. Hawkes, W. Owen Saxton, F. Peter Ottensmeyer and Azriel Rosenfeld (Editors). Published by Scanning Microscopy International, 1988, Chicago, IL, USA; ISSN 0892‐953X
Author(s) -
Russ John C.
Publication year - 1989
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300180513
Subject(s) - library science , citation , art history , computer science , art