Premium
Enhancement between layers in multiple‐layer thin‐film samples
Author(s) -
Willis James E.
Publication year - 1989
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300180404
Subject(s) - fluorescence , layer (electronics) , analytical chemistry (journal) , thin film , materials science , thin layer , analyte , intensity (physics) , chemistry , optics , nanotechnology , chromatography , physics
Secondary fluorescence effects are calculated and compared with the total fluorescence for multiple‐layer thin‐film samples of Fe, Ni and Fe, Ni, Cu, Cr. The ratio of secondary to total fluorescence for a given analyte is found to be greater in the system where the enhancer is in a layer which is closer to the surface. Secondary fluorescence effects are calculated for a Ni thin film on an Sn sample. Unusual acquisition conditions cause the intensity from the Ni thin film layer to exceed the intensity from a bulk sample of Ni.