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Analysis of metallic shred: A basic experiment
Author(s) -
Mantler M.,
Taut T.
Publication year - 1989
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300180306
Subject(s) - brass , materials science , scanner , metal , copper , pixel , plane (geometry) , optics , composite material , metallurgy , geometry , physics , mathematics
Metallic shred obtained by turning bulk copper, brass and steel was embedded in resin and count rates were measured from these specimens and from the original bulk material. The specimens were then sliced into 0.5 mm thick sheets parallel to the plane of the x‐ray beams and the distribution of the metal within each cut was mapped by an optical scanner. Fundamental parameter calculations were applied to compute the count rates from the shred specimens pixel by pixel according to the map and also the count rate ratios relative to the bulk material of the same composition. Whereas count rates between different measurement positions may vary by more than an order of magnitude owing to the statistical distribution of the metal grains, the computed values agree to within (typically) 10% (relative) with the experimental data from matching specimen areas.