Quantitative X‐ray fluorescence analysis of specimens with rough surfaces: Monte Carlo approach | Zendy

Ebel H. | Zendy; Poehn Ch. | Zendy

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Quantitative X‐ray fluorescence analysis of specimens with rough surfaces: Monte Carlo approach

Author(s) -

Ebel H.,

Poehn Ch.

Publication year - 1989

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.1300180305

Subject(s) - monte carlo method , photon , x ray fluorescence , probability distribution , physics , plane (geometry) , range (aeronautics) , fluorescence , distribution (mathematics) , optics , computational physics , statistical physics , materials science , geometry , mathematics , statistics , mathematical analysis , composite material

In general, the application of the fundamental parameter method in quantitative x‐ray fluorescence analysis is restricted to specimens with plane and smooth surfaces. For such surfaces, the correlation of path lengths x of incident tube photons and y of escaping fluorescent photons is well defined. For rough surfaces this correlation is described by distribution functions. Thus, for x 1 ≤ x ≤ x 2 a probability density Ø( y ) x1, x2 allows the probability of y values to be described within the range y A ≤ y ≤ y B . From the results it is now possible to describe probability distributions of rough surfaces by means of Monte Carlo calculations.

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