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Absorption and fluorescence corrections of characteristic x‐rays from thin spheres
Author(s) -
Zreiba Nuri A.,
Kelly Thomas F.
Publication year - 1988
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300170607
Subject(s) - spheres , absorption (acoustics) , scattering , plane (geometry) , physics , fluorescence , electron , optics , foil method , radiation , beam (structure) , atomic physics , cathode ray , x ray fluorescence , computational physics , materials science , geometry , quantum mechanics , mathematics , astronomy , composite material
Models of absorption and fluorescence corrections for characteristic x‐rays emitted from electron‐transparent spheres are presented for a stationary point probe and for a rastered or flooding beam. In both models, the primary inonzation event and subsequent x‐ray emission are assumed to occur anywhere along the electron‐beam axis within the sphere. Multiple scattering effects are not taken into account but absorption of the fluorescence radiation is taken into account. The integrals involved in both correction models are solved numerically and the results are compared with previous models of thin‐foil, plane‐parallel specimens. An analytical solution for the fluorescence correction is obtained when the primary x‐ray generation is assumed to originate at the center of the sphere. Both corrections are found to be less severe for submicron spheres than the corresponding corrections for plane‐parallel specimens.